Power Semiconductor Accelerated Life Testing

ATE Product Overview

Functional Test

Life/Burn-in Test

ATE Test Software

Product Literature

ATE Product Support

Sales & Support Offices

News

IPT6 Intepro PowerTest 6 Series

Intepro's Intepro PowerTest 6 Series are automated programmable high performance systems for extended lifetime testing of power semiconductors. Ideally suited for product development characterisation in the automotive industry, the complete solution comprises a test system, thermal oven, chiller, cold plates and test software.

 

With the capacity to test up to 100 DUTs at one time the IPT6 was designed to simulate the harsh electrical and environmental conditions demanded of the automotive, railway, aerospace and defence industries involved in the test of power semiconductors. Typical applications include:

 

Design Engineering Verification

Design Characterisation

Manufacturing Validation

 

 

Built around an open archictecture, the IPT6 solution can be tailored to meet your individual requirements and Intepro's dedicated engineering team will consult with you every step of the way from project specification to design, build and integration.

 

Click the links below for more information on the typical tests and applications.

 

Typical Tests for Accelerated Stress

Typical Applications for Accelerated Stress

 

Operation modes include: Linear, Switched, Saturated, Voltage Breakdown, Avalanche.

 

Highly accelerated life testing of DUTs

Power cycles provide thermal and electrical stressing of DUT

Trend monitoring with user defined warning and control limits

Junction temperature measurement

Rapid temperature cycling

Ambient temperature profiling

Detection of nascent failures with automated alert mechanism

Isolated DUT control

Automated programmable testing for a wide range of DUTs

 

Download the Brochure